A new method for the measurement of the Michel parameters that describe the daughter muon polarization in the τ− → μ−$$ \overline{\nu} $$μντ decay

Author:

Bodrov D.,Pakhlov P.

Abstract

Abstract This paper provides a detailed description of the method for the first direct measurement of all Michel parameters in the τ→ μ$$ \overline{\nu} $$ ν ¯ μντ decay related to the polarization of the daughter muon. An application of the suggested method in the existing and future experiments at e+e colliders is considered. We have performed a feasibility study for the future Super Charm-Tau Factory and Belle II experiments. For the first one, the sensitivity to the Michel parameters ξ′, ξ′′, η′′, α/A, and β/A is estimated. For the latter, only one Michel parameter, ξ′, for which the sensitivity is maximum, is considered.

Publisher

Springer Science and Business Media LLC

Subject

Nuclear and High Energy Physics

Reference30 articles.

1. W. Fetscher, H.J. Gerber and K.F. Johnson, Muon decay: complete determination of the interaction and comparison with the Standard Model, Phys. Lett. B 173 (1986) 102 [INSPIRE].

2. P. Langacker, Is the Standard Model unique?, Comments Nucl. Part. Phys. 19 (1989) 1 [INSPIRE].

3. Particle Data Group collaboration, Review of particle physics, PTEP 2020 (2020) 083C01 [INSPIRE].

4. D. Bryman, V. Cirigliano, A. Crivellin and G. Inguglia, Testing lepton flavor universality with pion, kaon, tau, and beta decays, arXiv:2111.05338 [INSPIRE].

5. P. Herczeg, On muon decay in left-right symmetric electroweak models, Phys. Rev. D 34 (1986) 3449 [INSPIRE].

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3