Author:
Garbolino Tomasz,Papa Gregor
Publisher
Springer Science and Business Media LLC
Reference42 articles.
1. Aktouf C, Robach C, Kač U, Novak F (1999) On-line testing of embedded architectures using idle computations and clock cycles. In: Proc. 5th IEEE international on-line testing workshop, Rhodes, Greece, pp 28–32
2. Bäck T (1996) Evolutionary algorithms in theory and practice. Oxford University Press, Oxford
3. Bäck T, Fogel DB, Michalewicz Z (2000) Evolutionary computation 1: basic algorithms and operators. Taylor & Francis, London
4. Bellos M, Kagaris D, Nikolos D (2002) Test set embedding based on phase shifters. In: Proceedings fourth European dependable computing conference, EDCC-4. Toulouse, France, pp 90–101
5. Cao B, Xiao L, Wang Y (2008) A low power deterministic test pattern generator for BIST based on cellular automata. In: Proc. 4th IEEE international symposium on electronic design, test & applications, DELTA 2008, Hong Kong, China, pp 266–269
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献