A framework to enhance generalization of deep metric learning methods using general discriminative feature learning and class adversarial neural networks

Author:

Al-Kaabi Karrar,Monsefi RezaORCID,Zabihzadeh Davood

Publisher

Springer Science and Business Media LLC

Subject

Artificial Intelligence

Reference34 articles.

1. Chopra S, et al. (2005) Learning a similarity metric discriminatively, with application to face verification. 2005 IEEE computer society conference on computer vision and pattern recognition (CVPR'05), IEEE

2. Hoffer E, Ailon N (2015). Deep metric learning using triplet network. International Workshop on Similarity-Based Pattern Recognition, Springer

3. Wang J, et al. (2014) Learning fine-grained image similarity with deep ranking. Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition

4. Ni J, et al. (2017) Fine-grained patient similarity measuring using deep metric learning. Proceedings of the 2017 ACM on conference on information and knowledge management

5. Sohn K (2016) Improved deep metric learning with multi-class n-pair loss objective. Advances in Neural Information Processing Systems

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