Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials-Reference-Cited by-同舟云学术

Critical comparison of ICP-OES, XRF and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials

Published:1995 Issue:3-4 Volume:352 Page:318-326
ISSN:0937-0633
Container-title:Fresenius' Journal of Analytical Chemistry
language:en
Short-container-title:Fresenius J Anal Chem

Author:

Kaiser G.,Meyer A.,Friess M.,Riedel R.,Harris M.,Jacob E.,T�lg G.

Publisher

Springer Science and Business Media LLC

Subject

Biochemistry,Analytical Chemistry,Biochemistry

Link

http://link.springer.com/content/pdf/10.1007/BF00322228.pdf

Reference22 articles.

1. Seyferth D, Wiseman GH (1984) J Am Ceram Soc 67:C 132

2. Peuckert M, Vaahs T, Br�ck M (1990) Adv Mater 2 No. 9:398?404

3. Riedel R (1991) In: Brook RJ (ed) Concise encyclopaedia of advanced ceramic materials. Pergamon Press, Oxford, p 299

4. Adv Chem Ser;D Seyferth,1990

5. Teusel I, R�ssel C (1990) J Mater Sc 25:3531

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