A service level model for the control wafers safety inventory problem-Reference-Cited by-同舟云学术

A service level model for the control wafers safety inventory problem

Published:2004-11-24 Issue:5-6 Volume:26 Page:591-597
ISSN:0268-3768
Container-title:The International Journal of Advanced Manufacturing Technology
language:en
Short-container-title:Int J Adv Manuf Technol

Author:

Chung Shu-Hsing,Kang He Yau,Pearn W.L.

Publisher

Springer Science and Business Media LLC

Subject

Industrial and Manufacturing Engineering,Computer Science Applications,Mechanical Engineering,Software,Control and Systems Engineering

Link

http://link.springer.com/content/pdf/10.1007/s00170-003-2028-9.pdf

Reference13 articles.

1. Lin YL (2000) The design of inventory control model for dummy/control wafers at the furnace area in the wafer fab. Dissertation, National Chiao Tung University, Hsin-Chu, Taiwan

2. Ghare PM, Scharader GH (1963) A model for exponentially decaying inventory system. Int J Prod Res 21:449–460

3. Covert TB, Philip GS (1973) An EOQ model with Weibull distribution deterioration. AIIIE Trans 5:323–326

4. Chang HJ, Dye CY (2000) An EOQ model with deteriorating items in response to a temporary sale price. Prod Plann Control 11(5):464–473

5. Chung KJ, Tsai SF (2001) Inventory systems for deteriorating items with shortages and a linear trend in demand-taking account of time value. Comput Oper Res 28(9):915–934

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