Author:
Xu Yizi,Ekin J. W.,Clickner C. C.,Fiske R. L.
Reference10 articles.
1. J. W. Ekin, S. E. Russek, C. C. Clickner, and B. Jeanneret, In situ noble metal YBa2Cu3O7 thin-film contacts, Appl. Phys. Lett., 62: 369 (1993).
2. Z. H. Gong, J. K. Grepstad, and R. Fagerberg, The YBCO(001)/Ag Interface: Correlation Between Specific Contact Resistance and Interfacial Microstructure, IEEE Trans. Appl. Supercond. 5: 2412 (1995).
3. J. W. Ekin, C. C. Clickner, S. E. Russek, and S. C. Sanders, Oxygen Annealing of Ex-Situ YBCO/Ag Thin-Film Interfaces, IEEE Trans. Appl. Supercond., 5: 2400 (1995).
4. Simon S. Cohen and Gennady Sh. Gildenblat, “VLSI Electronics Microstructure Science 13, Metal-Semiconductor Contacts and Devices,” Academic Press, New York (1986).
5. B. D. Hunt, M. G. Forrester, J. Talvacchio, J. D. McCambridge, and R. M. Young, High-Ta superconductor/normal-metal/superconductor edge junctions and SQUID with integrated groundplanes, Appl. Phys. Lett. 68: 3805 (1996).
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