Devices for Thermal Conductivity Measurements of Electroplated Bi for X-ray TES Absorbers-Reference-Cited by-同舟云学术

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Devices for Thermal Conductivity Measurements of Electroplated Bi for X-ray TES Absorbers

Published:2022-10-15 Issue:5-6 Volume:209 Page:1165-1171
ISSN:0022-2291
Container-title:Journal of Low Temperature Physics
language:en
Short-container-title:J Low Temp Phys

Author:

Quaranta Orlando^ORCID,Gades Lisa M.,Xue Cindy,Divan Ralu,Miller C. Suzanne,Patel Umeshkumar M.,Guruswamy Tejas,Miceli Antonino

Funder

Basic Energy Sciences

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics

Link

https://link.springer.com/content/pdf/10.1007/s10909-022-02876-9.pdf

Reference12 articles.

1. H.K. Collan, M. Krusius, G.R. Pickett, Phys. Rev. B 1, 2888 (1970). https://doi.org/10.1103/PhysRevB.1.2888

2. D. Yan et al., Appl. Phys. Lett. 111, 192602 (2017). https://doi.org/10.1063/1.5001198

3. S.M. Heald, JSR 22, 436–445 (2015). https://doi.org/10.1107/S1600577515001320

4. U. Patel, R. Divan, L. Gades et al., J Low Temp Phys 199, 384–392 (2020). https://doi.org/10.1007/s10909-019-02267-7

5. M. Holt, R. Harder, R. Winarski, V. Rose, Ann. Rev. Mater. Res. 43, 183–211 (2013). https://doi.org/10.1146/annurev-matsci-071312-121654

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