TSV constraints related to temperature excursion, pressure during molding, materials used and handling loads

Author:

Fałat Tomasz,Friedel Kazimierz,Marenco Norman,Warnat Stephan

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Coletti G et al (2005) Mechanical strength of silicon wafers and its modeling. In: Proceedings of 15th workshop on crystalline silicon solar cells and modules, Vail Colorado, USA, 7–10 August 2005

2. Coletti G et al (2006) Mechanical strength of silicon wafers depending on wafer thickness and surface treatment. In: Proceedings of 21st European photovoltaic solar energy conference and exhibition, Dresden, Germany, 4–8 September 2006

3. Pecht M et al (1999) Electronic packaging, materials and their properties. CRC Press, Washington

4. Steinzig M (2000) Bend tests of silicon ladders to determine ultimate strength. HYTEC Incorporated report HTN-102050-0016, 08/03/2000

5. Yu F et al (2002) Stress analysis in silicon die under different types of mechanical loading by finite element method (FEM). IEEE Trans Adv Packag 25(4):522–527. doi: 10.1109/TADVP.2002.807561

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