Statistical process and measurement control for micro production-Reference-Cited by-同舟云学术

Statistical process and measurement control for micro production

Published:2008-01-08 Issue:9-11 Volume:14 Page:1227-1232
ISSN:0946-7076
Container-title:Microsystem Technologies
language:en
Short-container-title:Microsyst Technol

Author:

Lanza G.,Fleischer J.,Schlipf M.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s00542-007-0508-9.pdf

Reference9 articles.

1. Dietrich E, Schulze A (2004) Eignungsnachweis von Prüfprozessen. Carl Hanser Verlag München, Wien

2. Fleischer J, Lanza G, Schlipf M, Behrens I (2006) Quality assurance in micro production. Microsys Technol 12(7):707–711

3. Fleischer J, Schlipf M, Behrens I, Peters J (2007) Aspects of estimating CMM measurement uncertainty for micro parts with respect to similarity requirements and influences of manufacturing processes. In: Proceedings 7th international conference of the EUSPEN, Bremen, Germany

4. ISO/TS (1995) 15530-3 Guide to the expression of uncertainty in measurement

5. Montgomery DC (2004) Introduction to statistical quality control, 4th edn. Wiley, London

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