Assessment of yield loss of wheat caused by spot blotch using regression model

Author:

Devi Hijam Meronbala,Mahapatra Sunita,Das Srikanta

Publisher

Springer Science and Business Media LLC

Subject

Plant Science,Agronomy and Crop Science

Reference11 articles.

1. Das S, Roy TK (1995) Assessment of yield loss in groundnut due to early and late leaf spots. Int Arachis Newsl (IAN). 15:34–36

2. Devi SN, Mahapatra S, Das S (2012) Effect of dates of sowing and inorganic fertilizers on leaf blight severity of wheat caused by Alternaria triticina. J Mycol Plant Pathol 42:439–442

3. Khan H, Chowdhury S (2011) Identification of resistance source in wheat germplasm against spot blotch disease caused by Bipolaris sorkiniana. Arch Phytopath Plant Prot 44:840–844

4. Knudsen GR, Johnson CS, Sprurr HW Jr. (1988) Use of a simulation model to explore fungicide strategies for control of cercospora leaf spot of Peanut. Peanut Sci 15:39–43

5. Mahapatra S, Das S (2016) Linear regression model for assessing the yield loss of mustard due to Alternaria leaf blight disease. Indian Phytopath 69:57–60

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