Testability-based partial scan analysis-Reference-Cited by-同舟云学术

Testability-based partial scan analysis

Published:1995 Issue:1-2 Volume:7 Page:61-70
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Parikh Prashant S.,Abramovici Miron

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF00993314.pdf

Reference22 articles.

1. E. Trischler, ?Testability Analysis and Incomplete Scan Path,?International Conference on Computer Aided Design, 1983, pp. 38?39, September 1983.

2. K.-T. Cheng and V.D. Agrawal, ?A Partial Scan Method for Sequential Circuits with Feedback,?IEEE Transactions on Computers, Vol. 39, pp. 544?547, April 1990.

3. S. Bhawmik, C.J. Lin, K.T. Cheng, and V.D. Agrawal, ?PASCANT: A Partial Scan and Test Generation System,?Proceedings of Custom Integrated Circuits Conference, pp. 17.3.1?17.3.4, May 1991.

4. D.H. Lee and S.M. Reddy, ?On Determining Scan Flip-Flops in Partial-Scan,?International Conference on Computer Aided Design. 1990, pp. 322?325, November 1990.

5. H.H.S. Gundlach and K.-D. Müller-Glaser, ?On Automatic Testpoint Insertion in Sequential Circuits,?Proceedings of International Test Conference, pp. 1072?1079, September 1990.

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