Development and applications of time-of-flight neutron depth profiling (TOF-NDP)-Reference-Cited by-同舟云学术

Development and applications of time-of-flight neutron depth profiling (TOF-NDP)

Published:2008-05-02 Issue:3 Volume:276 Page:623-630
ISSN:0236-5731
Container-title:Journal of Radioanalytical and Nuclear Chemistry
language:en
Short-container-title:J Radioanal Nucl Chem

Author:

Çetiner S. M.,Ünlü K.,Downing R. G.

Publisher

Springer Science and Business Media LLC

Subject

Health, Toxicology and Mutagenesis,Public Health, Environmental and Occupational Health,Spectroscopy,Pollution,Radiology, Nuclear Medicine and imaging,Nuclear Energy and Engineering,Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s10967-008-0609-7.pdf

Reference26 articles.

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2. D. Fink, Neutron Depth Profiling, Reports of the Hahn-Meitner-Institute (HMI-B), HMI-B 539, Berlin, 1996.

3. N. Bohr, Phil. Mag., 30 (1915) 581.

4. W. Bothe, Phys. Rev., 89 (1921) 1256.

5. G. Moliére, Z. Naturforsch., 3a (1948) 78.

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