Development of a flat-field XUV spectrograph for laser plasma interaction studies-Reference-Cited by-同舟云学术

Development of a flat-field XUV spectrograph for laser plasma interaction studies

Published:1999-12 Issue:6 Volume:24 Page:557-566
ISSN:0256-2499
Container-title:Sadhana
language:en
Short-container-title:Sadhana

Author:

Chowdhury A,Joshi R A,Kumbhare S R,Naik P A,Gupta P D

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://link.springer.com/content/pdf/10.1007/BF02745629.pdf

Reference20 articles.

1. Alexandrov Yu Met al 1991 Investigation of sensitometric characteristics of X-ray photoemulsions in the spectral range of 15–80 Å.Nucl. Instrum. Methods Phys. Res. A308: 343–346

2. Chaker M, Bareau V, Kieffer J C, Pepin H, Johnston T W 1989 Calibrated soft X-ray spectroscopy using transmission grating, pinhole and film.Rev. Sci. Instrum. 60: 3386–3390

3. Chaker Met al 1992 Laser plasma sources for proximity printing or projection X-ray lithography.J. Vac. Sci. Technol. B 10: 3239–3242

4. Chakera J A, Kumbhare S R, Gupta P D 1998 Characterisation of X-ray contact microscopic imaging in keV spectral region using laser produced plasmas.J. X-ray Sci. Technol. 8: 1–9

5. Ditmire Tet al 1995 Amplification of XUV harmonic radiation in a gallium amplifier.Phys. Rev. A51: 4337–4340

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