1. Abrahams, S. C. (1956)Quart. Rev. (London) 10, 407.
2. Aldoshin, S. M., D'yachenko, O. A., Atovmian, L. O., Minkin, V. I., Bren, V. A., and Palui, G. D. (1982)Zh. Strukt. Khim. 23, 107.
3. Belletti, D., Cantoni, A., and Pasquinelli, G. (1988)Gestione on line di diffrattometro a cristallo singolo Siemens AED con sistema IBM PS2/30, Centro di studio per la strutturistica diffrattometrica del CNR, Internal report 1/88.
4. Benesi, H. A., and Hildebrand, J. H. (1949)J. Am. Chem. Soc. 71, 2703.
5. Bhowmik, B., and Srimani, P. K. (1973)Spectrochim. Acta,29A, 935.