Selection of 8-channel silicon phototransistor arrays for space applications, based on wafer-level radiation and high-temperature storage tests-Reference-Cited by-同舟云学术

Selection of 8-channel silicon phototransistor arrays for space applications, based on wafer-level radiation and high-temperature storage tests

Published:2022-04 Issue:2 Volume:14 Page:263-285
ISSN:1868-2502
Container-title:CEAS Space Journal
language:en
Short-container-title:CEAS Space J

Author:

Eshkevar Vakili Aref,Bregoli Matteo^ORCID,Ceriani Silvia,Bassetti Daniel,Ficorella Francesco,Pancheri Lucio,Bringer Charlotte

Funder

GSTP funding scheme (General Support Technology Programme) of the European Space Agency

OPTOI Company and University of Catania

Publisher

Springer Science and Business Media LLC

Subject

Space and Planetary Science,Aerospace Engineering

Link

https://link.springer.com/content/pdf/10.1007/s12567-022-00443-2.pdf

Reference23 articles.

1. Buchner, S. “Radiation Hardness Assurance (RHA) for Space Systems”, Perot Systems Government Services, Presented by S. Buchner at the 4th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA), West Palm Beach, FL, December, (2008)

2. Poivey, C. “Radiation hardness assurance (RHA) for space systems,” EPFL Sp. Cent., no. July 2002, pp. 1–58, [Online]. Available: http://radhome.gsfc.nasa.gov/radhome/papers/NSREC02_SC_pres.pdf. (2009) Accessed 1 Oct 2021

3. Campola, M. J., Pellish, J. A. “Radiation Hardness Assurance : Evolving for NewSpace NASA Electronic Parts Manager / NASA Electronic Parts and Packaging ( NEPP ) Program Deputy Manager,” [Online]. Available: https://ntrs.nasa.gov/api/citations/20200000016/downloads/20200000016.pdf. (2019) Accessed 1 Oct 2021

4. Bezerra, F. “Radiation test standards for space,” RADSAGA Train. Work., no. March, (2018)

5. Muschitiello, M., Zadeh, A., Costantino, A. “Irradiation characterization of EEE components for space application,” RADSAGA initial training event, October, (2017)