1. L. Fel’dman and D. Mayer, in: Principles of the Surface and Thin Film Analysis [in Russian], Mir, Moscow (1989).
2. R. P. Sharma, L. E. Rehn, and P. M. Baldo, Phys. Rev., B43, 13711–13713 (1991).
3. A. S. Borovik, A. P. Kobzev, and E. A. Kovaleva, Fiz. Khim. Obrab. Mater., No. 5, 69–72 (1998).
4. A. S. Borovik, A. A. Epifanov, D. A. Korneev, and V. S. Malyshevskii, Preprint No. P14-92-396, Joint Institute for Nuclear Research (1992).
5. V. I. Makarov, R. P. Slabospitskii, N. A. Skakun, et al., Fiz. Nizk. Temp., 17, No. 4, 476–480 (1991).