Investigation of the Optical Properties of InSb Thin Films Grown on GaAs by Temperature-Dependent Spectroscopic Ellipsometry-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Investigation of the Optical Properties of InSb Thin Films Grown on GaAs by Temperature-Dependent Spectroscopic Ellipsometry

Published:2019-05 Issue:2 Volume:86 Page:276-282
ISSN:0021-9037
Container-title:Journal of Applied Spectroscopy
language:en
Short-container-title:J Appl Spectrosc

Author:

Liang Yuanlan,Wang Fangze,Luo Xuguang,Li Qingxuan,Lin Tao,Ferguson Ian T.,Yang Qingyi,Wan Lingyu,Feng Zhe Chuan

Publisher

Springer Science and Business Media LLC

Subject

Spectroscopy,Condensed Matter Physics

Link

http://link.springer.com/content/pdf/10.1007/s10812-019-00812-6.pdf

Reference29 articles.

1. V. K. Dixit, B. V. Rodrigues, and H. L. Bhat, J. Appl. Phys., 90, 1750–1753 (2001).

2. V. K. Dixit, B. V. Rodrigues, H. L. Bhat, R. Venkataraghavan, K. S. Chandrasekaran, and B. M. Arora, J. Cryst. Growth, 235, 154–160 (2002).

3. T. D. Mishima and M. B. Santos, J. Vac. Sci. Technol. B, B, 1472–1474 (2004).

4. M. Shafa, H. Ji, L. Gao, P. Yu, Q. H. Ding, Z. H. Zhou, H. D. Li, X. B. Niu, J. Wu, and Z. M. Wang, Mater. Lett., 169, 77–81 (2016).

5. M. Hilal, B. Rashid, S. H. Khan, and A. Khan, Mater. Chem. Phys., 184, 41–48 (2016).

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Morphology and Optical Characteristics of TiO2 Nanofilms Grown by Atomic-Layer Deposition on a Macroporous Silicon Substrate;Journal of Applied Spectroscopy;2024-09-12

2. Ảnh hưởng của độ dày lên tính chất màng mỏng InSb chế tạo bằng phương pháp lắng đọng laser xung trên đế Silic;Journal of Military Science and Technology;2022-12-28

3. Absorption Coefficient of Bulk III-V Semiconductor Materials: A Review on Methods, Properties and Future Prospects;Journal of Electronic Materials;2022-08-23

4. A New Method for Measuring Refractive Index with a Laser Frequency-shifted Feedback Confocal Microscope;CURR OPT PHOTONICS;2020

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3