Surface potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever-Reference-Cited by-同舟云学术

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Surface potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever

Published:2001-03 Issue:S1 Volume:72 Page:S97-S100
ISSN:0947-8396
Container-title:Applied Physics A
language:en
Short-container-title:Appl Phys A

Author:

Kobayashi K.,Yamada H.,Umeda K.,Horiuchi T.,Watanabe S.,Fujii T.,Hotta S.,Matsushige K.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390100641.pdf

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fine structures of organic photovoltaic thin films probed by frequency-shift electrostatic force microscopy;Japanese Journal of Applied Physics;2016-06-24

2. Development of a Novel Surface Elemental Analysis Methodology: X-ray-Aided Noncontact Atomic Force Microscopy (XANAM);Bulletin of the Chemical Society of Japan;2015-02-15

3. Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever;e-Journal of Surface Science and Nanotechnology;2015

4. Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever;Journal of Applied Physics;2011-06

5. Conservative and dissipative force imaging of switchable rotaxanes with frequency-modulation atomic force microscopy;Physical Review B;2005-09-23

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