X-ray dynamical diffraction on superlattice with unequal layer thicknesses-Reference-Cited by-同舟云学术

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X-ray dynamical diffraction on superlattice with unequal layer thicknesses

Published:1997-02 Issue:2-4 Volume:19 Page:531-536
ISSN:0392-6737
Container-title:Il Nuovo Cimento D
language:en
Short-container-title:Nouv Cim D

Author:

Dyshekov A. A.,Khapachev Yu. P.,Tarasov D. A.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF03041013.pdf

Reference9 articles.

1. Esaki L.,IEEE. J. Quantum Electron.,QE-22 (1986) 1611.

2. Herman M. A.,Semiconductor Superlattices (Akademie-Verlag, Berlin) 1986.

3. Khapachev Yu. P.,Phys. Status Solidi B,120 (1983) 155.

4. Khapachev Yu. P. andChukhovskii F. N.,Phys. Metals,11, (1993) 914.

5. Dyshekov A. A., Tarasov D. A. andKhapachev Yu. P.,Phis’ma Ž Ėksp. Theor. Fiz.,21 (1995) 6.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dynamical Diffraction of X-Rays in Superlattices;Uspehi Fiziki Metallov;2001-12-01

2. X-ray diffraction scattering and determination of the structural parameters of a film with a variable strain gradient;Technical Physics;1999-06

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