Reduction of internal stress in SU-8 photoresist layer by ultrasonic treatment

Author:

Du LiQun,Wang QiJia,Zhang XiaoLei

Publisher

Springer Science and Business Media LLC

Subject

General Engineering,General Materials Science

Reference17 articles.

1. Zhang L G, Chen D, Yang F, et al. Research on SU-8 resist photolithography process (in Chinese). Opt Prec Eng, 2002, 10(3): 266–269

2. Li B, Chen Q F. Low-stress ultra-thick SU-8 UV photolithography process for MEMS. Microlith Microfab Microsyst, 2005, 4(4): 043008

3. Chang H K, Kim Y K. UV-LIGA process for high aspect ratio structure using stress barrier and C-shape etch hole. Sens Actuators A-Phys, 2000, 84(3): 342–350

4. Du L Q, Zhu S M. Study on internal stress of thick SU-8 layer in MEMS (in Chinese). Opt Prec Eng, 2007, 15(9): 1377–1382

5. Lorenz H, Despont M, Fahrni N, et al. High-aspect-ratio, ultra thick, negative-tone near UV-LIGA photoresist and its applications for MEMS. Sens Actuators A-Phys, 1998, 64(1): 33–39

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