Quantitative Electron Probe Microanalysis of Multi-layer Structures

Author:

Bastin Guillaume F.,Dijkstra Johannes M.,Heijligers Hans J. M.,Klepper Dick

Publisher

Springer Vienna

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Theoretical modelling of X-ray production in thin films characterization with electron probe:;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-11

2. The use of a ϕ(ρz) model for simultaneous determination of composition and thickness in analytical transmission electron microscopy;Ultramicroscopy;2000-09

3. Application of Low Voltage Scanning Electron Microscopy and Energy Dispersive X-Ray Spectroscopy;Impact of Electron and Scanning Probe Microscopy on Materials Research;1999

4. Comparison of Different Methods to Characterize Thin a-Si:H Films;Modern Developments and Applications in Microbeam Analysis;1998

5. Progress in the Characterization of Layered Structures by X-Ray Microanalysis;Microscopy Microanalysis Microstructures;1995

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