1. J. Z. Hu, L. D. Merkle, C. S. Menoni, and I. L. Spain, “Crystal Data for High-Pressure Phases of Silicon,” Phys. Rev. B, vol. 34, no. 7, 4679–4684 (1987).
2. A. Smakula and J. Kalnajs, “Precision Determination of Lattice Constants with a Geiger-Counter X-Ray Diffractometer,” Phys. Rev., vol. 99, no. 6, 1737–1743 (1955).
3. K. Ohsaka, S. K. Chung, W. K. Rhim, and J. C. Hölzer, “Densities of Si Determined by an Image Digitizing Technique in Combination with an Electrostatic Levitator,” Appl. Phys. Lett., vol. 70, no. 4, 423–25 (1997).
4. P. P. Ewald, “Tagung des erweiterten Tabellenkomitees in Zürich, 28.–31. Juli 1930,” Z. Kristallogr., vol. 75, 159–160 (1930).
5. C. Hermann, “Zur systematischen Strukturtheorie. IV. Untergruppen,” Z. Kristallogr., vol. 69, 533–555 (1929).