Finite state machine synthesis with embedded test function
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/BF00938685.pdf
Reference20 articles.
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4. H. Fujiwara, Y. Nagao, T. Sasao, and K. Kinoshita, “Easily testable sequential machines with extra inputs,”IEEE Trans. Comput., vol. C-24, pp. 821–826, August 1975.
5. E.P. Hsieh, “Checking experiments for sequential machines,”IEEE Trans. Comput., vol. C-20, pp. 1152–1166, October 1971.
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