Experimental study on heavy ion single-event effects in flash-based FPGAs-Reference-Cited by-同舟云学术

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Experimental study on heavy ion single-event effects in flash-based FPGAs

Published:2016-02 Issue:1 Volume:27 Page:
ISSN:1001-8042
Container-title:Nuclear Science and Techniques
language:en
Short-container-title:NUCL SCI TECH

Author:

Yang Zhen-Lei,Wang Xiao-Hui,Su Hong,Liu Jie,Liu Tian-Qi,Xi Kai,Wang Bin,Gu Song,She Qian-Shun

Publisher

Springer Science and Business Media LLC

Subject

Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://link.springer.com/content/pdf/10.1007/s41365-016-0015-8.pdf

Reference22 articles.

1. M. Nicolaidis (ed.), Soft errors in modern electronic systems. in frontiers in Electronic Testing, vol. 41(2011). Doi: 10.1007/978-1-4419-6993-4

2. L. Sterpone, N. Battezzati, F.L. Kastensmidt et al., An analytical model of the propagation induced pulse broadening (PIPB) effects on single event transient in flash-based FPGAs. IEEE Trans. Nucl. Sci. 58, 2333–2340 (2011). doi: 10.1109/TNS.2011.2161886

3. Z.G. Zhang, J. Liu, M.D. Hou et al., Angular dependence of multiple-bit upset response in static random access memories under heavy ion irradiation. Chin. Phys. B 22, 086102 (2013). doi: 10.1088/1674-1056/22/8/086102

4. P.E. Dodd, M.R. Shaneyfelt, J.R. Schwank et al., Current and future challenges in radiation effects on CMOS electronics. IEEE Trans. Nucl. Sci. 57, 1747–1763 (2010). doi: 10.1109/TNS.2010.2042613

5. Y. Yahagi, H. Yamaguchi, E. Ibe et al., A novel feature of neutron-induced multi-cell upsets in 130 and 180 nm SRAMs. IEEE Trans. Nucl. Sci. 54, 1030–1036 (2007). doi: 10.1109/TNS.2007.897066

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1. Heavy ion-induced MCUs in 28 nm SRAM-based FPGAs: upset proportions, classifications, and pattern shapes;Nuclear Science and Techniques;2022-12

2. Prototype of single-event effect localization system with CMOS pixel sensor;Nuclear Science and Techniques;2022-11

3. Differences in MBUs induced by high-energy and medium-energy heavy ions in 28 nm FPGAs;Nuclear Science and Techniques;2022-09

4. Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis;Nuclear Science and Techniques;2021-10

5. A single-ion monitor based on coincident measurement of secondary electrons for single event effect research;Review of Scientific Instruments;2020-04-01

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