Author:
Eppstein David,Goodrich Michael T.,Hirschberg Daniel S.
Publisher
Springer Berlin Heidelberg
Reference21 articles.
1. Atallah, M.J., Frikken, K.B., Blanton, M., Cho, Y.: Private combinatorial group testing. In: ACM Symp on Information, Computer and Communications Security (ASIACCS), pp. 312–320 (2008)
2. Beigel, R., Hurwood, W., Kahale, N.: Fault diagnosis in a flash. In: Proc. IEEE Foundations of Computer Science (FOCS), pp. 571–580 (October 1995)
3. Beigel, R., Kosaraju, S.R., Sullican, G.F.: Locating faults in a constant number of parallel testing rounds. In: ACM Symp. on Parallel Algorithms and Architectures (SPAA), pp. 189–198 (1989)
4. Beigel, R., Margulis, G., Spielman, D.A.: Fault diagnosis in a small constant number of parallel testing rounds. In: ACM Symp. on Parallel Algorithms and Architectures (SPAA), pp. 21–29 (1993)
5. Blecher, P.M.: On a logical problem. Discrete Mathematics 43(1), 107–110 (1983)
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献