Author:
Rashid Farhana,Agrawal Vishwani D.
Publisher
Springer Berlin Heidelberg
Reference22 articles.
1. Agrawal, P., Agrawal, V.D.: On Improving the Efficiency of Monte Carlo Test Generation. In: Digest of 5th International Fault Tolerant Computing Symp., Paris, France, pp. 205–209 (June 1975)
2. Agrawal, P., Agrawal, V.D.: Probabilistic Analysis of Random Test Generation Method for Irredundant Combinational Networks. IEEE Trans. Computers C-24, 691–695 (1975)
3. Agrawal, P., Agrawal, V.D.: On Monte Carlo Testing of Logic Tree Networks. IEEE Trans. Computers C-25, 664–667 (1976)
4. Bushnell, M.L., Agrawal, V.D.: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits. Springer (2000)
5. Eichelberger, E.B., Lindbloom, E.: Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test. IBM Jour. Research and Development 27(3), 265–272 (1983)
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献