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Security and Device Aging

Published:2021 Issue: Volume: Page:1-5
ISSN:
Container-title:Encyclopedia of Cryptography, Security and Privacy
language:
Short-container-title:

Author:

Karimi Naghmeh

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-27739-9_1643-1

Reference10 articles.

1. Calimera A, Macii E, Poncino M (2009) NBTI-aware sleep transistor design for reliable power-gating. In: Great Lakes Symposium on VLSI (GLSVLSI), pp 333–338

2. Karimi N, Kanuparthi AK, Wang X, Sinanoglu O, Karri R (2015) MAGIC: malicious aging in circuits/cores. ACM Trans Archit Code Optim (TACO) 12(1):1–25

3. Karimi N, Danger JL, Guilley S (2018a) Impact of aging on the reliability of delay PUFs. J Electron Test Theory Appl (JETTA) 34(5):571–586

4. Karimi N, Guilley S, Danger JL (2018b) Impact of aging on template attacks. In: Great Lakes Symposium on VLSI (GLSVLSI), pp 455–458

5. Kraak D et al (2018) Device aging: a reliability and security concern. In: European Test Symposiums (ETS), pp 1–10

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. RO-SVD: A Reconfigurable Hardware Copyright Protection Framework for AIGC Applications;2024 IEEE 35th International Conference on Application-specific Systems, Architectures and Processors (ASAP);2024-07-24

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