Author:
Baras Dorit,Fournier Laurent,Ziv Avi
Publisher
Springer Berlin Heidelberg
Reference20 articles.
1. Wile, B., Goss, J.C., Roesner, W.: Comprehensive Functional Verification -The Complete Industry Cycle. Elsevier, Amsterdam (2005)
2. Piziali, A.: Functional Verification Coverage Measurement and Analysis. Springer, Heidelberg (2004)
3. Fine, S., Ziv, A.: Coverage directed test generation for functional verification using Bayesian networks. In: Proceedings of the 40th Design Automation Conference, pp. 286–291 (2003)
4. Lecture Notes in Computer Science;L. Fournier,2008
5. Wagner, I., Bertacco, V., Austin, T.: Microprocessor verification via feedback-adjusted Markov models. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 26(6), 1126–1138 (2007)
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