1. R. L. Paul, R. M. Lindstrom, Rev. Progr. in Quantitative Nondestructive Evaluation, Vol. 13,D. O. Thompson andD. E. Chimenti (Eds), Plenum Press, New York, 1994, p. 1619.
2. R. L. Paul, H. M. Privett III, R. M. Lindstrom, W. J. Richards, R. R. Greenberg, submitted to Metallurgical Transactions.
3. R. P. Gardner, C. L. Dobbs, R. L. Paul, Trans. Amer. Nucl. Soc., 71 (1994) 165.
4. R. L. Paul, R. M. Lindstrom, Diagnostic Techniques for Semiconductor Processing, MRS Symp. Proc. Vol. 324,O. J. Glembocki, S. W. Pang, F. H. Pollak, G. M. Crean andG. Larrabee (Eds), Materials Research Society, Pittsburgh, PA, 1994, p. 403.
5. R. L. Paul, R. M. Lindstrom, Proc. Intern. Workshop on Semiconductor Characterization, Am. Inst. Phys., Woodbury, NY, in press.