Effective automatic defect classification process based on CNN with stacking ensemble model for TFT-LCD panel

Author:

Kim Myeongso,Lee Minyoung,An Minjeong,Lee HongchulORCID

Publisher

Springer Science and Business Media LLC

Subject

Artificial Intelligence,Industrial and Manufacturing Engineering,Software

Reference30 articles.

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3. Clevert, D., Unterthiner, T., & Hochreiter, S. (2015). Fast and accurate deep network learning by exponential linear units (ELUs). arXiv:1511.07289v5 .

4. Das, R., Turkoglu, I., & Sengur, A. (2009). Effective diagnosis of heart disease through neural network ensembles. Expert Systems with Applications, 36, 3976–3982.

5. Faghih-Roohi, S., Hajizadeh, S., Nunez, A., Babuska R., & De Schutter, B. (2016). Deep convolutional neural networks for detection of rail surface defects. In International joint conference on neural networks (IJCNN).

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