Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence,Industrial and Manufacturing Engineering,Software
Reference41 articles.
1. Abadi, M., Barham, P., Chen, J., Chen, Z., Davis, A., Dean, J., & Devin, M. (2016). Tensorflow: A system for large-scale machine learning. In In 12th {USENIX} Symposium on Operating Systems Design and Implementation, 2016.
2. Badmos, O., Kopp, A., Bernthaler, T., & Schneider, G. (2020). Image-based defect detection in lithium-ion battery electrode using convolutional neural networks. Journal of Intelligent Manufacturing, 31, 885–897.
3. Badrinarayanan, V., Kendall, A., & Cipolla, R. (2017). Segnet: A deep convolutional encoder-decoder architecture for image segmentation. IEEE Transactions on Pattern Analysis and Machine Intelligence, 39(12), 2481–2495.
4. Bali, R., & Sarkar, D. (2016). R Machine Learning By Example, Packt Publishing Ltd, 2016.
5. Baslamisli, A. S., Hoang-An, L., & Gevers, T. (2018). CNN based learning using reflection and retinex models for intrinsic image decomposition. In IEEE Conference on Computer Vision and Pattern Recognition, 2018.
Cited by
51 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献