Defects in HgTe and CdHgTe Grown by Molecular Beam Epitaxy-Reference-Cited by-同舟云学术

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Defects in HgTe and CdHgTe Grown by Molecular Beam Epitaxy

Published:2008-04-09 Issue:9 Volume:37 Page:1444-1452
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Selvig E.,Tonheim C.R.,Lorentzen T.,Kongshaug K.O.,Skauli T.,Haakenaasen R.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-008-0447-y.pdf

Reference27 articles.

1. R. Haakenaasen, H. Steen, T. Lorentzen, L. Trosdahl-Iversen, A.D. van Rheenen, and H. Syversen, J. Electron. Mater. 31, 710 (2002). doi: 10.1007/s11664-002-0224-2

2. R. Haakenaasen, H. Steen, E. Selvig, T. Lorentzen, A.D. van Rheenen, L. Trosdahl-Iversen, H. Syversen, D. Hall, and N. Gordon, J. Electron. Mater. 34, 922 (2005). doi: 10.1007/s11664-005-0043-3

3. G.L. Hansen, J.L. Schmit, and T.N. Casselman, J. Appl. Phys. 53, 7099 (1982). doi: 10.1063/1.330018

4. P.S. Wijewarnasuriya, M. Zandian, D.B. Young, J. Waldrop, D.D. Edwall, W.V. McLevige, D. Lee, and J. Arias, J. Electron. Mater. 28, 649 (1999). doi: 10.1007/s11664-999-0048-4

5. J.B. Varesi, A.A. Buell, J.M. Peterson, R.E. Bornfreund, M.F. Vilela, W.A. Radford, and S.M. Johnson, J. Electron. Mater. 32, 661 (2003). doi: 10.1007/s11664-003-0049-7

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. MBE Growth and Characterization of Strained HgTe (111) Films on CdTe/GaAs*;Chinese Physics Letters;2020-03-01

2. Characterization of (111)B and (211)B CdZnTe Substrates for HgCdTe Growth;Journal of Electronic Materials;2019-06-13

3. One-Step Hydrothermal Controlled Synthesis of HgTe Nanorods;Applied Mechanics and Materials;2013-02

4. Study of Macrodefects in MBE-Grown HgCdTe Epitaxial Layers Using Focused Ion Beam Milling;Journal of Electronic Materials;2012-05-31

5. The Effects of Microvoid Defects on MWIR HgCdTe-Based Diodes;Journal of Electronic Materials;2011-06-04

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