Isothermal aging of near-eutectic Sn-Ag-Cu solder alloys and its effect on electrical resistivity

Author:

Cook B. A.,Anderson I. E.,Harringa J. L.,Kang S. K.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. J. Bath, C. Handwerker, and E. Bradley, Circuits Assembly 11, 31 (2000).

2. C.M. Miller, I.E. Anderson, and J.F. Smith, J. Electron. Mater. 23, 595 (1994).

3. I.E. Anderson, T.E. Bloomer, R.L. Terpstra, J.C. Foley, B.A. Cook, and J.L. Harringa, Proc. Int. Brazing and Soldering Conf. (Miami, FL: American Welding Society, 2000), pp. 575–586.

4. I.E. Anderson, B.A. Cook, J.L. Harringa, and R.L. Terpstra, JOM 54, 26 (2002).

5. B.A. Cook, I.E. Anderson, J.L. Harringa, and R.L. Terpstra, J. Electron. Mater. 31, 1190 (2002).

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