Contemporary Approaches to Ensuring the Uniformity of Measurements of High-Speed Pulsed Electrical Processes
Author:
Publisher
Springer Science and Business Media LLC
Subject
Applied Mathematics,Instrumentation
Link
https://link.springer.com/content/pdf/10.1007/s11018-022-02000-z.pdf
Reference16 articles.
1. P. D. Hale, D. F. Williams, A. Dienstfrey, et al., “Traceability of high-speed electrical waveforms at NIST, NPL, and PTB,” 2012 Conf. on Precision Electromagnetic Measurements, Washington, DC, USA, July 1–6, 2012, IEEE (2012), pp. 522–523, https://doi.org/10.1109/CPEM.2012.6251033.
2. W. Tian, D. Allal, G. Boudebs, et al., “Development of an electro-optic sampling system at LNE,” ibid., pp. 654–655, https://doi.org/10.1109/CPEM.2012.6251099.
3. Z. Feng, K. Zhao, B. Li, et al., “Pulse waveform characterization by electro-optic sampling at NIM,” 2020 Conf. on Precision Electromagnetic Measurements (CPEM), Denver, CO, USA, August 24–28, 2020, IEEE (2020), pp. 1–2, https://doi.org/10.1109/CPEM49742.2020.9191721.
4. M. Bieler, P. Struszewski, A. Feldman, et al., “International comparison on ultrafast waveform metrology,” ibid., pp. 1–2, https://doi.org/10.1109/CPEM49742.2020.9191926.
5. C. Shank, A. Laubereau, et al., Ultrashort Laser Pulses: Generation and Applications, W. Kaiser (ed.), Springer-Verlag, Berlin, Heidelberg (1993), https://doi.org/10.1007/BFb0070977.
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