1. M. Abramovici, M. A. Breuer, A. D. FriedmanDigital systems testing and testable design Computer Science Press1990
2. L. J. Avra, E.J. McCluskey, “Synthesizing for Scan Dependence in Built-in Self-testable Designs”Proceedings IEEE International Test Conf1993, pp. 734–743
3. S. Baluja, R. Caruana, “Removing the Genetics from the Standard Genetic Algorithm”Proceedings of the 12 t h Annual Conference on Machine Learning (ML-95)1995, pp. 38–46
4. T. BäckOptimal Mutation Rates in Genetic SearchProceedings of the 5th International Conference on Genetic Algorithms and their Applications, 1993, pp. 2–8
5. P.H. Bardell, W.H. McAnney, “Self-Testing of Multichip Logic Modules”Proceedings IEEE International Test Conference1982, pp. 200–204