Application of a High-Resolution Magnetic Spectrometer to Near-Surface Materials Analysis-Reference-Cited by-同舟云学术

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Application of a High-Resolution Magnetic Spectrometer to Near-Surface Materials Analysis

Published:1976 Issue: Volume: Page:457-469
ISSN:
Container-title:Ion Beam Surface Layer Analysis
language:
Short-container-title:

Author:

Hirvonen James K.,Hubler Graham K.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-8876-4_40

Reference12 articles.

1. C. W. Snyder, S. Rubin, W. A. Fowler, and C. C. Lauritsen, Rev. Sci. Inst., 21, 852 (1950)

2. E. Bøgh, Channeling, Ed. D. V. Morgan, John Wiley and Sons, p. 435 (1973)

3. J. M. Harris, W. K. Chu, and M-A. Nicolet, Thin Solid Films, 19, 259 (1973)

4. J. F. Ziegler, R. F. Lever, and J. K. Hirvonen, “Computer Analysis of Nuclear Backscattering,” this Conference

5. J. K. Hirvonen, A. K. Revesz, and T. D. Kirkendall, to be published

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rutherford Backscattering Spectroscopy;Encyclopedia of Analytical Chemistry;2006-09-15

2. The Rossendorf broad-range magnetic spectrometer for high resolution RBS and NRA;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-07

3. Multilayer analysis by high resolution backscattering spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-04

4. Materials Research with Channeling Combined with RBS, NRA and PIXE;Nuclear Physics Applications on Materials Science;1988

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