Author:
Kim Sungshin,Bae Hyeon,Cheon Seong-Pyo,Kim Kwang-Baek
Publisher
Springer Berlin Heidelberg
Reference10 articles.
1. Kim, S., Vachtsevanos, G., Dorrity, J.L.: An intelligent approach to integration of textile processes. In: ASME 1996 Intl. Congress & Exposition, Atlanta, GA, pp. 73–79 (1996)
2. Vachtsevanos, G., Dorrity, J.L., Kumar, A., Kim, S.: Advanced application of statistical and fuzzy control to textile processes. IEEE Trans. on Industry Applications 30, 510–516 (1994)
3. Jasper, W.J., Garnier, S.J., Potlapalli, H.: Texture characterization and defect detection using adaptive wavelets. Optical Engineering 35, 3140–3149 (1996)
4. Brad, R.: Quality Assurance by Automated Defect Detection of Textile Fabrics. In: Proc. of XI-th Int. Symp. SINTES, Craiova Romania, vol. II, pp. 487–491 (2003)
5. Chan, C.H., Pang, G.: Fabric defect detection by Fourier analysis. IEEE Trans. Ind. Application 36, 1267–1276 (2000)
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献