Electrical/thermoelectric characterization of electrodeposited Bi x Sb2−x Te3 thin films-Reference-Cited by-同舟云学术

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Electrical/thermoelectric characterization of electrodeposited Bi x Sb2−x Te3 thin films

Published:2013-09 Issue:5 Volume:9 Page:687-691
ISSN:1738-8090
Container-title:Electronic Materials Letters
language:en
Short-container-title:Electron. Mater. Lett.

Author:

Yoo In-Joon,Lim Dong Chan,Myung Nosang V.,Jeong Young-Keun,Kim Yang Do,Lee Kyu Hwan,Lim Jae-Hong

Publisher

Springer Science and Business Media LLC

Subject

Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s13391-013-2246-8.pdf

Reference19 articles.

1. J. K. Lee, M. W. Oh, S. D. Park, B. S. Kim, B. K. Min, M. H. Kim, and H. W. Lee, Electron. Mater. Lett. 8, 659 (2012).

2. H. J. Lee, S. Hyun, H. S. Park, and S. Han, Electron. Mater. Lett. 7, 45 (2011).

3. F. Xiao, C. Hangarter, B. Yoo, Y. Rheem, K. H. Lee, and N. V. Myung, Electrochim. Acta, 53, 8103 (2008).

4. R. Venkatasubramanian, T. Colpitts, E. Watko, M. Lamvik, and N. J. Masry, Cryst. Growth 170, 817 (1997).

5. B. Aboulfarah, A. Mzerd, A. Giani, A. Boulouz, F. Pascal- Delannoy, A. Foucaran, and A. J. Boyer, Mater. Sci. Lett. 18, 1095 (1999).

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