Author:
Gösele U.,Schroer E.,Werner P.,Tan T. Y.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Point Defects in Semiconductors;Physical Chemistry of Semiconductor Materials and Processes;2015-08-07
2. Properties of Silicon Crystals;Handbook of Silicon Based MEMS Materials and Technologies;2010