Microstructural stability of silicon and beryllium nanofilms in periodic Si/Be multilayer mirrors investigated by Raman scattering spectroscopy-Reference-Cited by-同舟云学术

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Microstructural stability of silicon and beryllium nanofilms in periodic Si/Be multilayer mirrors investigated by Raman scattering spectroscopy

Published:2023-05-13 Issue:14 Volume:97 Page:4205-4209
ISSN:0973-1458
Container-title:Indian Journal of Physics
language:en
Short-container-title:Indian J Phys

Author:

Kumar Niranjan^ORCID,Nezhdanov Aleksey V.,Smertin Ruslan M.,Polkovnikov Vladimir N.,Chkhalo Nikolay I.

Funder

Russian Science Foundation

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

https://link.springer.com/content/pdf/10.1007/s12648-023-02752-6.pdf

Reference30 articles.

1. N I Chkhalo et al. Opt. Lett. 42 5070 (2017).

2. D L Voronov et al. J. Appl. Phys. 111 93521 (2012).

3. M V Svechnikov et al. Opt. Exp. 26 33718 (2018).

4. A N Nechay et al. AIP Adv. 8 75202 (2018).

5. M G Sertsu, A Sokolov, N Chkhalo, V Polkovnikov, N Salashchenko, M Svechnikov and F Schäfers Opt. Eng. 60 44103 (2021).

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