1. Van Renesse, R.: Optical document security. Optoelectronics Library. Artech House (2005)
2. Buraga-Lefebvre, C., Coëtmellec, S., Lebrun, D., Özkul, C.: Application of wavelet transform to hologram analysis: three-dimensional location of particles. Optics and Lasers in Engineering 33, 409–421 (2000)
3. Janucki, J., Owsik, J.: A Wiener filter based correlation method intended to evaluate effectiveness of holographic security devices. Optics Communications 218, 221–228 (2003)
4. Kwon, H.J., Park, T.H.: An automatic inspection system for hologram with multiple patterns. In: SICE, Annual Conference, pp. 2663–2666 (2007)
5. Park, T.H., Kwon, H.-J.: Vision inspection system for holograms with mixed patterns. In: IEEE Conference on Automation Science and Engineering (CASE), pp. 563–567 (2010)