EPR study of the influence of defect structure on electrical properties of ZnO varistors-Reference-Cited by-同舟云学术

EPR study of the influence of defect structure on electrical properties of ZnO varistors

Published:1985-05 Issue:5 Volume:20 Page:1660-1670
ISSN:0022-2461
Container-title:Journal of Materials Science
language:en
Short-container-title:J Mater Sci

Author:

Vlasova M. V.,Kakazey N. G.,Kostić P.,Milošević O.,Uskoković D.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/BF00555269.pdf

Reference12 articles.

1. P. Kostić, O. Milošević, D. Uskoković, “Fizika, hemija i technologiija silikatnih materijala”, edited by M. M. Ristić (Insitute of Technical Sciences of the SASA, Beograd, 1984) p. 187.

2. K. Eda, “Grain Boundaries in Semiconductors” (North-Holland, New York, Amsterdam, Oxford, 1982) p. 343.

3. R. Einzinger, “Grain Boundaries in Semiconductors” (North Holland, New York, Amsterdam, Oxford, 1982) p. 343.

4. G. M. Zhidomirov, Ja. S. Lebedev, S. M. Dobryakov, N. Ya. Steinshneider, A. K. Chirkov, V. A. Gubanov, “Interpretaciya sloznih spektrov EPR”, (Nauka, Moscow, 1975).

5. N. N. Tikhomirova, S. N. Dobryakov, I. V. Bikolaeva,Phys. Status Solidi (a) 10 (1972) 593.

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