Spark ablation as sample introduction device for ICP-AES: Analysis of free cutting steels-Reference-Cited by-同舟云学术

Spark ablation as sample introduction device for ICP-AES: Analysis of free cutting steels

Published:1990-01 Issue:1-6 Volume:101 Page:315-325
ISSN:0026-3672
Container-title:Mikrochimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

Vujicic Goran,Steffan Ilse

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01244184.pdf

Reference8 articles.

1. J. C. van Loon, H. Haraguchi, K. Fuwa, in:Inductively Coupled Plasma Emission Spectroscopy, Part II (Chemical Analysis, Vol. 90), (P. W. J. M. Boumans, ed.), Wiley, New York, 1987, chapt. 7, p. 217.

2. K. Slickers, J. Iten,Spectrochim. Acta 1987,42B, 791.

3. E. H. Choot, G. Horlick,Spectrochim. Acta 1986,41B, 889.

4. E. H. Choot, G. Horlick,Spectrochim. Acta 1986,41B, 907.

5. E. H. Choot, G. Horlick,Spectrochim. Acta 1986,41 B, 925.

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