X-Ray Diffraction Residual Stress Analysis: One of the Few Advanced Physical Measuring Techniques That Have Established Themselves for Routine Application in Industry-Reference-Cited by-同舟云学术

X-Ray Diffraction Residual Stress Analysis: One of the Few Advanced Physical Measuring Techniques That Have Established Themselves for Routine Application in Industry

Published: Issue: Volume: Page:301-314
ISSN:
Container-title:Advances in Solid State Physics
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Author:

Nierlich Wolfgang,Gegner Jürgen

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-540-74325-5_24.pdf

Reference8 articles.

1. E. Macherauch, P. Müller: Das sin2 ψ-Verfahren der röntgenographischen Spannungsmessung, Z. angew. Physik 13, 305–312 (1961)

2. M. Moore, W. Evans: Mathematical correction for stress in removed layers in x-ray diffraction residual stress analysis, SAE Trans. 66 (1958)

3. U. Wolfstieg: Personal communication, unpublished

4. W. Nierlich, J. Gegner: Material response analysis of rolling bearings using x-ray diffraction measurements, Materials Week (October 2001) proc. 4th Int. Congress Werkstoffwoche-Partnerschaft Frankfurt 2002 (CD-ROM ISBN 3-88355-302-6)

5. W. Nierlich, J. Gegner, M. Brückner: X-ray diffraction in failure analysis of rolling bearings, Mater. Sci. Forum 524–525, 147–152 (2006)

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