Microstructure — Property relationships in nanocrystalline oxide thin films-Reference-Cited by-同舟云学术

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Microstructure — Property relationships in nanocrystalline oxide thin films

Published:2000-05 Issue:3-4 Volume:6 Page:294-311
ISSN:0947-7047
Container-title:Ionics
language:en
Short-container-title:Ionics

Author:

Kosacki I.,Anderson H. U.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy,General Engineering,General Materials Science,General Chemical Engineering

Link

http://link.springer.com/content/pdf/10.1007/BF02374080.pdf

Reference47 articles.

1. A.P. Alivisatos, MRS Bulletin20, 23 (1995).

2. H. Gleiter, Prog. Mater. Sci.33, 223 (1989).

3. G.C. Hadjipanayis, R.W. Siegel, (Eds.) Nanophase Materials, Synthesis-Properties-Applications, Kluwer Academic Publishers, Dodrecht 1994.

4. R.W. Siegel, Physics Today, October, pp. 64 (1993).

5. R.W. Siegel, in: Encyclopedia of Applied Physics, (G.L. Trigg, Ed.),11, VSH, New York 1994, pp.173–200.

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