CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis-Reference-Cited by-同舟云学术

CEP: Correlated Error Propagation for Hierarchical Soft Error Analysis

Published:2013-04 Issue:2 Volume:29 Page:143-158
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Chen Liang,Ebrahimi Mojtaba,Tahoori Mehdi B.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-013-5365-0.pdf

Reference39 articles.

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3. Baumann R (2005) Soft errors in advanced computer systems. IEEE Des Test Comput 22(3):258–266

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5. Borkar S (2005) Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. IEEE Micro 25(6):10–16

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