A Probabilistic Approach to Diagnose SETs in Sequential Circuits
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-013-5361-4.pdf
Reference38 articles.
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2. Asadi G, Tahoori MB (2005) Soft error modeling and protection for sequential circuits. In: Proceedings of IEEE international symposium on defect and fault tolerance in VLSI systems
3. Asadi G, Tahoori MB (2005) An analytical approach for soft error rate estimation in digital circuits. In: Proceedings of international symposium on circuits and systems
4. Bryant RE (1986) Graph based algorithms for boolean function manipulation. In: IEEE transanctions on computer aided design, pp 677–691
5. Borkar S (2005) Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. Micro IEEE 25(6):10–16
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