An Efficient Contact Screening Method and its Application to High-Reliability Non-Volatile Memories
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-016-5605-1.pdf
Reference10 articles.
1. Baker K, Gronthoud G, Lousberg M, Schanstra I, Hawkins C (1999) Defect-based delay testing of resistive vias-contacts a critical evaluation. Proceedings International Test Conference, Atlantic City, NJ, pp 467–476
2. Dai JY, Ansari S, Tay CL, Tee SF, Er E and Redkar S (2001) Failure mechanism study for high resistance contact in CMOS devices. Proc. 8th International Symp. Physical and Failure Analysis of Integrated Circuits. IPFA 2001, pp 130–133
3. Fellner J, Schatzberger G Patent US 8,189,409 B2 Readout Circuit for Rewriteable Memories and Readout Methode for Same
4. Leisenberger FP and Schatzberger G (2015) Efficient contact screening of compact NVMs for high reliability automotive applications. Proc. 20th International Mixed-Signal Testing Workshop (IMSTW), Paris, pp 1–6
5. Mammen Thomas, J Pathak, JP, Leisenberger F, Wachmann E, Schatzberger G, Wiesner A, Schrems M (2006) A non-volatile embedded memory for high temperature automotive and high-retention applications. 7th International Symposium on Quality Electronic Design (ISQED’06), San Jose, CA, 2006, pp 6–596
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