Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-008-5078-y.pdf
Reference15 articles.
1. Agrawal VD (1981) An information theoretic approach to digital fault testing. IEEE Trans Comput 30:582–587
2. Bennett CH (1973) Logic reversibilty of computation. IBM J Res Develop 17:525–532
3. Chakraborty A (2005) Synthesis of reversible circuits for testing with universal test set and C-testability of reversible iterative logic arrays. In: Proc. 18th intl. conf. VLSI design
4. Compano R, Molenkamp L, Paul DJ (1999) Technology roadmap for nanoelectroincs. European Commission IST programme, Future and Emerging Technologies
5. Friedman, AD (1973) Easily testable iterative systems. IEEE Trans Computers C-22:1061–1064
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