Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection
Author:
Funder
National Natural Science Foundation of China
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
https://link.springer.com/content/pdf/10.1007/s10836-023-06087-2.pdf
Reference42 articles.
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2. Argyrides C, Ferreira RR, Lisboa CA, Carro L (2011) Decimal Hamming: A Software-Implemented Technique to Cope with Soft Errors. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2011:11–17. https://doi.org/10.1109/DFT.2011.35
3. Baumann RC (2005) Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans Device Mater Reliab 5(3):305–316. https://doi.org/10.1109/TDMR.2005.853449
4. Benso A, Chiusano S, Prinetto P (2000) A software development kit for dependable applications in embedded systems. Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) 170–178. https://doi.org/10.1109/TEST.2000.894204
5. Benso A, Chiusano S, Prinetto P, Tagliaferri L (2000) A C/C++ source-to-source compiler for dependable applications. Proceeding International Conference on Dependable Systems and Networks. DSN 71–78. https://doi.org/10.1109/ICDSN.2000.857517
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